Optical Profiler

Trade Agreement: WTO-AGP/NAFTA/AIT/Canada FTAs with Peru/Colombia/Panama Tendering Procedures: Generally only one firm has been invited to bid Non-Competitive Procurement Strategy: Exclusive Rights Comprehensive Land Claim Agreement: No Vendor Name and Address: Sensofar LLC 8655 E Via Dr Ventura Unit G168 Scottsdale Arizona United States 85377 Nature of Requirements:

Optical Profiler

31030-167204/A Lopez, Maria Telephone No. - (905) 615-2071 ( ) Fax No. - (905) 615-2060 ( )

1. Advance Contract Award Notice (ACAN) An ACAN is a public notice indicating to the supplier community that a department or agency intends to award a contract for goods, services or construction to a pre-identified supplier, thereby allowing other suppliers to signal their interest in bidding, by submitting a statement of capabilities. If no supplier submits a statement of capabilities that meets the requirements set out in the ACAN, on or before the closing date stated in the ACAN, the contracting officer may then proceed with the award to the pre-identified supplier. 2. Definition of the requirement The Specialty Coatings and Microfabrication Team at NRC-AST-London is expanding new research activities in the area of laser based surface structuring, texturing and polishing of materials. Surface treatment of materials such as metals, ceramics, composites and polymers is widely recognized as the key step to produce enhanced functionality. Laser micro/nano structuring techniques can be used effectively to create black, super-hydrophobic, self-cleaning surfaces, hydrophilic surfaces and to enhance strong, robust and highly predictable bonds between surfaces. Laser ablation essentially imparts highly precise 2D & 3D topographical micro/nano size features and chemical changes to a surface which can lead to desirable functionalities. Surface properties such as anti-corrosion, anti-icing, drag reduction, friction and wear reduction, stickiness, surface wettability and adhesion strongly depend on the accuracy and metrology of laser machined features. Often, laser texturing of metallic nanoparticles exhibit distinctive optical characteristics, influenced by micro/nano feature shape, size, distribution, host material and design of surface for many products and applications. The main criterion for choosing an integrated optical metrology system for the research and development is the ability to measure geometric quality of micro/nano features with nanometer (nm) resolution (lateral, height), repeatability on large sample surfaces (at least 15 cm x 15 cm), and integrated ability to measure surfaces on a variety of materials (e.g. with reflectivity between 0.05% to 100%) using most appropriate measuring technique.

3. Criteria for assessment of the Statement of Capabilities (Minimum Essential Requirements)

Any interested supplier must demonstrate by way of a statement of capabilities that its equipment meets the following requirements: • Capable of focus variation, confocal microscopy, and interferometry as one single unit • Large 154 mm x 154 mm stage travel/measurement range • Stage capable of holding loads up to 20kg • Capable of stitched multi-field measurements over the travel range • Unique configuration, no moving parts in the optical path enables low noise and high accuracy • The compact micro-display system enables multiple modes to generate a sequence of illumination patterns for confocal images, bright field microscopy, focus variation measurement and with selected objective interferometric measurements. All modes operate with the same illumination source and optical path. • Flexible illumination optionallows sample measurements with low reflectivity and those composed of dissimilar or transparent materials. • Multiple LED light sources (different wavelengths including an integrated ring light) • Optional adjustable column with heights up to 1 meter • Quantitative measurements with immersion objective • Operating software capable of: o ergonomic user-interface for navigation, acquisition, visualization, and analysis of data for separate and/or combined confocal images, bright field microscopy, focus variation measurement and with selected objective interferometric measurements o online video screen for adjustment and viewing of sample in different multiple modes of navigating in X/Y and Z including fast preview pane o screen settings for scanlength, speed, area, and measurement type including programming of stitched measurements for 154 mm x 154 mm stage travel/measurement range o visualization of 3D-Isometric, Contour, Profile, Histogram, Bearing curve etc. including lighting and shadow options, true color rendering when color image is acquired, and linear profile extraction from surfaces o term removal, data filtering, step heights, distance and slopes, data Scaling, Fourier analysis, calculation of shape and roughness parameters according to ASME B46.1 and DIN standards o data export in a variety of formats from image (jpg, pdf) to raw point cloud output and full resolution (16 bit) TIFF format specifically designed for input to laser texture systems o data export into at least oneof CAD formats (e.g., STL). • The ring light can be easily mounted on an objective to increase image data capture through uniform illumination specifically in focus variation mode operation.

4. Applicability of the trade agreements to the procurement The procurement is subject to the following trade agreements:

Agreement on Internal Trade (AIT) World Trade Organization - Agreement on Government Procurement (WTO-AGP) North American Free Trade Agreement (NAFTA)

5. Justification for the Pre-Identified Supplier

The S-Neox 3D optical metrology system is capable of non-contact microscopic surface measurements and characterization. The system measures surface topography over vertical ranges from 1nm to several millimeters and lateral range from sub-micron to tens of millimeters. The 3D surface topography can be analyzed to provide a variety of quantitative information such as surface roughness, step height, angles, curvature profiles, side-wall slopes (up to 700) etc. Surface measurement with the S Neox can be performed precisely using techniques such as focus variation, bright field microscopy, confocal microscopy, phase shifting and white light scanning interferometry which are integrated with SENSOFAR’s patented solid state micro-display control technology for surface illumination using selectable RGB LEDs for best images and height resolution of